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Big Analog/RF Verification:
Complex-Block Characterization &  Full-Circuit Performance Simulation

Through extensive real-world examples this paper presents the state-of-the-art in big analog/RF verification as enabled by Berkeley Design Automation technology. It is based on working closely with numerous design teams from top-tier semiconductor suppliers to world-class startups on production circuits often under tremendous tapeout pressure. In all cases the examples are real, the accuracy is designer verified to the SPICE noise floor, and performance comparisons are based on using equivalent compute hardware.

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Efficient Noise Analysis for Complex Non-Periodic Analog/RF Blocks

This white paper provides an overview of noise in semiconductors and noise analysis methods. It continues with a detailed description of transient noise analysis, its application to non-periodic complex blocks, and its implementation in the Berkeley Design Automation Analog FastSPICE™ (AFS) circuit simulator. This paper concludes with AFS transient noise analysis results for a number of challenging production circuits.

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Precision Circuit Analysis™ Technology
Addressing a New Class of Analog & RF Verification Problems

Precision Circuit Analysis technology addresses verification challenges associated with nanometer-scale GHz CMOS analog and RF circuitry. Combining innovative applied mathematics and optimized numerical analysis, Berkeley Design Automation developed this technology from the ground up, never compromising accuracy, and proving it versus silicon every step of the way. The result: true SPICE accuracy, 5x-10x performance, and vastly superior convergence versus any alternative. Precision Circuit Analysis tools require no block-level tuning and are fully compatible with today’s most popular SPICE simulators, RF simulators, and their environments.

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