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Overview
Device
noise is critical in sub-90nm CMOS processes, and it
limits circuit performance at 45nm CMOS and below. Only AFS Transient
Noise delivers nanometer SPICE accurate device noise analysis for
every type of circuit including all ADCs, DACs, integer-N PLLs, and
fractional-N PLLs. AFS Transient
Noise consistently produces results
that correlate to within 1 dB to 2 dB to silicon measurements. Running
it requires adding just one or two parameters to a transient
simulation, and it has <2x overhead versus a transient-only
simulation.
Benefits
- nanometer SPICE
accuracy
- 5x-10x
faster
than any other tool
- 5x-10x
higher
capacity than any other tool
- Analyzes
white
noise and flicker noise
- Supports
standard netlist, model, and output formats
- Full
integration in the leading EDA design environment
- Simulator
option recommendations
from the DNA
Advisor
Target
Applications
- ADCs
(sigma-delta, pipelined, video, etc.)
- DACs
- PLLs
(integer-N and fractional-N)
- Full
transmit
and receive chains
- Frequency
synthesizers
The example below is device noise analysis results for a production
sigma-delta ADC. AFS Transient
Noise accurately predicts ~25 dB device noise impact which
correlates to within <1.5 dB of
silicon measurement. For more information see the following white
papers:
Technology
& Use Model
Transient noise analysis injects random white and flicker noise for
each device noise source at each timestep during transient simulation
to produce output waveforms that include realistic device noise
effects. Post-processing the waveforms transforms the device noise
effect into frequency domain for comparison to specifications.
Transient noise analysis applies all types of circuits and is the only
transistor-level noise analysis technique for non-periodic circuits
such as sigma-delta ADCs and frac-N PLLs. AFS Transient Noise Analysis
is extremely fast, with <2x per timestep overhead compared to an AFS Platform
transient-only simulation.
Because this technique is built on transient simulation, the underlying
circuit simulator accuracy and performance is critical. AFS Transient
Noise Analysis utilizes the AFS Circuit Simulator to provide nanometer SPICE
accuracy with a potential dynamic range of >120 dB.
AFS Transient
Noise Analysis is very straightforward to use. It uses
industry-standard netlists and models, and it is fully integrated into
the leading EDA design environment. Designers only add one or two
parameters to a standard transient simulation. AFS Transient Noise
produces the same standard output file formats as the AFS Platform and
includes sophisticated post-processing capabilities.
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