Overview
Device noise is critical in sub-90nm CMOS processes and fundamentally limits circuit performance at 45nm and below. AFS RF Analysis (AFS RF) is the industry’s first nanometer SPICE accurate device noise analysis (DNA) for RF circuits. AFS RF accurately analyzes nanometer-scale effects for all types of pre-layout and post-layout periodic circuits.

AFS RF provides the industry’s only full-spectrum device noise analysis capability, delivering nanometer SPICE accuracy for every run. All other RF tools inherently tradeoff accuracy for performance by limiting the number of sidebands or harmonics. For complex circuits AFS RF is also 5 to 10 times faster than other RF tools. AFS RF key features include:

Full-Spectrum Periodic Noise Analysis 
AFS full-spectrum periodic noise analysis (pnoise) computes the noise of periodically-driven circuits such as mixers, switched-capacitor filters, phase detectors, and charge pumps. AFS full-spectrum pnoise analysis is faster than transient noise analysis for periodic circuits and provides additional diagnostic information such as noise source contributions. For more...

Harmonic Balance (HB) Single-Tone Analysis
The AFS single-tone Harmonic Balance analysis (AFS HB) is a frequency-based RF analysis method applicable to moderately nonlinear circuits. AFS HB provides superior dynamic range and performance for such circuits. For more ...

AFS RF Specifications
AFS RF uses industry-standard netlists and models. It can be run standalone or fully integrated within the leading EDA design environment. It produces standard output file formats and includes sophisticated post-processing and analysis capabilities.

• Analyses: 
• Periodic analyses: PSS, OSCPSS, VCOPSS, PNOISE,HB PSS, HB PNOISE,  OSCNOISE, VCONOISE, PAC, PXF